Test Chip Design and Data Analytics for Yield Learning in 7nm Semiconductor Technologies

Duke Electrical Computer Engineering Colloquium
Speaker Name
Shawn Blanton
Date and Time
-
Location
LSRC D106
Notes
Lunch served at 11:45 am.
Abstract

In this talk, a new type of logic characterization vehicle (LCV) that simultaneously optimizes design, test, and diagnosis for yield learning is described. The Carnegie-Mellon LCV is a test chip composed of logic standard cells that uses constant-testability theory and logic/layout diversity to create a parameterized design that exhibits both front- and back-end demographics of a product-like, customer design. Analysis of various CMU-LCV designs (one of which has >4M gates) demonstrates that design time and density, test and diagnosis can all be simultaneously optimized. Several of our designs have been taped out in volume in state-of-the-art technologies with first test results now under analysis. In addition, we describe how the unique structure of the CMU-LCV can be exploited to improve diagnosis of test-chip failures, even those suffering from multiple failures. Real silicon data is used to prove the efficacy of the approach.

Short Biography

Shawn Blanton is The Trustee Professor in Electrical and Computer Engineering at Carnegie Mellon University where he formerly served as director of the Center for Silicon System Implementation, an organization that consisted of 18 faculty members and over 80 PHD students that focused on the design and manufacture of silicon-based systems.  He also served as the Associate Director of the SYSU-CMU Joint Institute of Engineering. Professor Blanton’s research interests are housed in the Advanced Chip Testing Laboratory (ACTL, www.ece.cmu.edu/~actl) and include the design, verification, test and diagnosis of integrated, heterogeneous systems. He has published many papers in these areas and has several issued and pending patents in the area of IC test and diagnosis. Prof. Blanton has received the National Science Foundation Career Award for the development of a microelectromechanical systems (MEMS) testing methodology and two IBM Faculty Partnership Awards. He is a Fellow of the IEEE, the recipient of several best paper awards, and is the recipient of the 2006 Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology.

Host
Krishnendu Chakrabarty