Reflections on Mentoring, Diversity, and Inclusion

Duke Electrical Computer Engineering Colloquium
Speaker Name
Shawn Blanton
Date and Time
-
Location
Fitzpatrick Center Schiciano Auditorium Side A, room 1464
Notes
Lunch served at 11:45 am.
Abstract

Please join us as we welcome visiting speaker Dr. Shawn Blanton, Trustee Professor of Electrical and Computer Engineering at Carnegie Mellon University. At this seminar he will discuss his academic and professional journey in the field of Computer Engineering as well as his outstanding work to foster an inclusive and supportive environment for students of diverse backgrounds in engineering through mentoring and outreach. This seminar will be part I of a two-part series. In part II, Dr. Blanton will give a seminar on January 15th from 12-1pm on his research in The Advanced Chip Test Laboratory (ACTL) which develops and implements data-mining techniques for improving the operation, design, manufacturing and testing of integrated systems. Our research involves data-mining algorithm development, data analysis, chip design and fabrication in collaboration with various industrial partners that currently include IBM, NVIDIA, Qualcomm, CISCO Systems, Intel, GlobalFoundries, and ARM. This will be located in LSRC D106.

RSVP at https://bit.ly/2T2UDQI by Friday, January 11th, 2019.

Short Biography

Shawn Blanton is The Trustee Professor in Electrical and Computer Engineering at Carnegie Mellon University where he formerly served as director of the Center for Silicon System Implementation, an organization that consisted of 18 faculty members and over 80 PHD students that focused on the design and manufacture of silicon-based systems.  He also served as the Associate Director of the SYSU-CMU Joint Institute of Engineering. Professor Blanton’s research interests are housed in the Advanced Chip Testing Laboratory (ACTL, www.ece.cmu.edu/~actl) and include the design, verification, test and diagnosis of integrated, heterogeneous systems. He has published many papers in these areas and has several issued and pending patents in the area of IC test and diagnosis. Prof. Blanton has received the National Science Foundation Career Award for the development of a microelectromechanical systems (MEMS) testing methodology and two IBM Faculty Partnership Awards. He is a Fellow of the IEEE, the recipient of several best paper awards, and is the recipient of the 2006 Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology.

Host
Johnna Frierson